Statistical Analysis of Semiconductor Images

  • Sarah Karasek (Speaker)
  • Friedl, H. (Contributor)
  • Peter Scheibelhofer (Contributor)

Activity: Talk or presentationTalk at workshop, seminar or courseScience to science

Period16 Jul 201820 Jul 2018
Event titleInternational Workshop on Statistical Modelling 2018
Event typeConference
LocationBristol, United KingdomShow on map
Degree of RecognitionInternational