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Tomographic atom probe: a new tool for nanoscale characterization
Leisch, M.
(Speaker)
Institute of Solid State Physics (5130)
Activity
:
Talk or presentation
›
Invited talk
›
Science to science
Period
2 Sept 1995
→
7 Sept 1995
Event title
6th Intern. Autumn Meeting Gettering and defect engineering in semiconductor technology
Event type
Conference