XXXIX "Jaszowiec" International School & Conference on the Physics of Semiconductors

Hofer, F. (Speaker)

Institute of Electron Microscopy and Nanoanalysis (5190)

Activity: Talk or presentation › Invited talk › Science to science

Description

Talk: The Advanced Sensitivity of Energy-filtering Transmission Electron Microscopy

Period	23 Jun 2010
Event title	XXXIX "Jaszowiec" International School & Conference on the Physics of Semiconductors
Event type	Conference