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XXXIX "Jaszowiec" International School & Conference on the Physics of Semiconductors
Hofer, F.
(Speaker)
Institute of Electron Microscopy and Nanoanalysis (5190)
Activity
:
Talk or presentation
›
Invited talk
›
Science to science
Description
Talk: The Advanced Sensitivity of Energy-filtering Transmission Electron Microscopy
Period
23 Jun 2010
Event title
XXXIX "Jaszowiec" International School & Conference on the Physics of Semiconductors
Event type
Conference