AIM - Combined High-Speed Atomic Force Microscopy and Triple-Ion Microscopy for Correlated Analysis

Project: Research project

Project Details


The AIM project plans on the development of a novel high-speed AFM for integration into a state-of-the-art Triple-Ion Microscopes. The combination of novel self-sensing cantilevers for high-speed imaging and a highly compact scanner design will enable seamless integration into the very-high-vacuum environment without restricting inherent Triple-Ion microscope operation. This AIM microscope will combine the strengths of the two different imaging techniques, which allows entirely new correlative analysis for a broad range of in-situ applications at (sub)-nanometer scale.
Effective start/end date1/08/1728/02/20


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