AIM - Combined High-Speed Atomic Force Microscopy and Triple-Ion Microscopy for Correlated Analysis

The AIM project plans on the development of a novel high-speed AFM for integration into a state-of-the-art Triple-Ion Microscopes. The combination of novel self-sensing cantilevers for high-speed imaging and a highly compact scanner design will enable seamless integration into the very-high-vacuum environment without restricting inherent Triple-Ion microscope operation. This AIM microscope will combine the strengths of the two different imaging techniques, which allows entirely new correlative analysis for a broad range of in-situ applications at (sub)-nanometer scale.