Electron-microscopical investigation of oxide layers on metals

  • Hofer, Ferdinand (Principal Investigator (PI))
  • Schmied, Mario Michael (Co-Investigator (CoI))
  • Warbichler, Peter (Co-Investigator (CoI))

Project: Research area

Project Details


Thin oxide layers are prepared on the surface of nickel and titanium foils by using electrochemical methods. The layers are characterized by analytical electron microscopy of cross-sectioned samples which have been prepared by ion-milling. TEM-imaging, electron diffraction and EELS-spectrometry are used to measure thickness, crystallography and chemical composition of the oxide layers.
Effective start/end date1/01/9931/07/00


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