Thin oxide layers are prepared on the surface of nickel and titanium foils by using electrochemical methods. The layers are characterized by analytical electron microscopy of cross-sectioned samples which have been prepared by ion-milling. TEM-imaging, electron diffraction and EELS-spectrometry are used to measure thickness, crystallography and chemical composition of the oxide layers.
|Effective start/end date||1/01/99 → 31/07/00|
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