Project Details
Description
Microanalysis with high detection sensitivity by means of wave-length dispersive x-ray spectrometry (WDXS) in a scanning electron microscope (SEM) using the STEM mode. The methodical developments will be applied to characterise materials and nanostructured devices.
Status | Finished |
---|---|
Effective start/end date | 1/07/08 → 31/12/10 |
Fingerprint
Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.