NILsimtos - Device simulation and temperature dependent measurements of critical OTFT parameters for the optimisation of the semiconductor growth in NIL-processed active devices

  • Marchl, Marco (Co-Investigator (CoI))
  • Zojer, Karin (Principal Investigator (PI))
  • Zojer, Egbert (Principal Investigator (PI))
  • Gruber, Manfred (Co-Investigator (CoI))

Project: Research project

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Material Science