Scanning Electron Microscopy , X-ray spectrometry and Electron Backscatter Diffraction

  • Schmied, Mario Michael (Co-Investigator (CoI))
  • Zankel, Armin (Co-Investigator (CoI))
  • Wagner, Julian (Co-Investigator (CoI))
  • Elis, Christof (Co-Investigator (CoI))
  • Schröttner, Hartmuth (Co-Investigator (CoI))
  • Bahr, Peter (Co-Investigator (CoI))
  • Reichmann, Angelika (Co-Investigator (CoI))

Project: Research area

Project Details

Description

Morphological investigations of organic and anorganic specimens by scanning- and field emission scanning electron microscopy (SEM FE-SEM and ESEM). Cryogenc investigations of radiation sensitive specimens and specimens liquid at room temperature. Electron microbeam analysis by energy- and wavelength dispersive X-ray spectrometry (EDXS and WDXS). Layer thickness measurement (in the submicrometer range) image processing, crystal orientation maps and phase analysis by EBSD; in situ experiments in the ESEM.
StatusFinished
Effective start/end date1/01/95 → 31/01/03

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