2D Maps for Visual Analysis and Retrieval in Large Multi-Feature 3D Model Databases

Benjamin Bustos, Daniel A. Keim, Christian Panse, Tobias Schreck

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	IEEE Visualization 2004
Publisher	Institute of Electrical and Electronics Engineers
Pages	1-2
ISBN (Print)	0-7803-8788-0
DOIs	https://doi.org/10.1109/VISUAL.2004.2
Publication status	Published - 2004
Event	IEEE Visualization Conference: IEEE VIS 2004 - Austin, Tex., United States Duration: 10 Oct 2004 → 15 Oct 2004

Conference	IEEE Visualization Conference
Country/Territory	United States
City	Austin, Tex.
Period	10/10/04 → 15/10/04

Fields of Expertise

@inproceedings{845fa8ffea174ffcb0ce87ae30b959be,

title = "2D Maps for Visual Analysis and Retrieval in Large Multi-Feature 3D Model Databases",

author = "Benjamin Bustos and Keim, {Daniel A.} and Christian Panse and Tobias Schreck",

year = "2004",

doi = "10.1109/VISUAL.2004.2",

language = "English",

isbn = "0-7803-8788-0",

pages = "1--2",

booktitle = "IEEE Visualization 2004",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "IEEE Visualization Conference : IEEE VIS 2004 ; Conference date: 10-10-2004 Through 15-10-2004",

}

TY - GEN

T1 - 2D Maps for Visual Analysis and Retrieval in Large Multi-Feature 3D Model Databases

AU - Bustos, Benjamin

AU - Keim, Daniel A.

AU - Panse, Christian

AU - Schreck, Tobias

PY - 2004

Y1 - 2004

U2 - 10.1109/VISUAL.2004.2

DO - 10.1109/VISUAL.2004.2

M3 - Conference paper

SN - 0-7803-8788-0

SP - 1

EP - 2

BT - IEEE Visualization 2004

PB - Institute of Electrical and Electronics Engineers

T2 - IEEE Visualization Conference

Y2 - 10 October 2004 through 15 October 2004

ER -