2D Maps for Visual Analysis and Retrieval in Large Multi-Feature 3D Model Databases

Benjamin Bustos, Daniel A. Keim, Christian Panse, Tobias Schreck

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationIEEE Visualization 2004
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Print)0-7803-8788-0
Publication statusPublished - 2004
EventIEEE Visualization Conference: IEEE VIS 2004 - Austin, Tex., United States
Duration: 10 Oct 200415 Oct 2004


ConferenceIEEE Visualization Conference
Country/TerritoryUnited States
CityAustin, Tex.

Fields of Expertise

  • Sonstiges

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