Original language | English |
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Pages (from-to) | 66-76 |
Journal | Applied Surface Science |
Volume | 252 |
Issue number | 1 |
Publication status | Published - 2005 |
A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films
Gerald Kothleitner, Michael Rogers, A. Berendes, W. Bock, Bernd Kolbesen
Research output: Contribution to journal › Article › peer-review