A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films

Michael Rogers, Gerald Kothleitner, Bernhard Schaffer, W. Waldhauser

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	EDGE 2005 - Book of Abstracts
Publisher	.
Pages	48-48
Publication status	Published - 2005
Event	Enhanced Data Generated by Electrons - Grundlsee, Austria Duration: 1 May 2005 → 5 May 2005

Conference	Enhanced Data Generated by Electrons
Country/Territory	Austria
City	Grundlsee
Period	1/05/05 → 5/05/05

Cite this

@inproceedings{e54d840001b641d8921620290a3ad715,

title = "A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films",

author = "Michael Rogers and Gerald Kothleitner and Bernhard Schaffer and W. Waldhauser",

year = "2005",

language = "English",

pages = "48--48",

booktitle = "EDGE 2005 - Book of Abstracts",

publisher = ".",

note = "Enhanced Data Generated by Electrons ; Conference date: 01-05-2005 Through 05-05-2005",

}

TY - GEN

T1 - A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films

AU - Rogers, Michael

AU - Kothleitner, Gerald

AU - Schaffer, Bernhard

AU - Waldhauser, W.

PY - 2005

Y1 - 2005

M3 - Conference paper

SP - 48

EP - 48

BT - EDGE 2005 - Book of Abstracts

PB - .

T2 - Enhanced Data Generated by Electrons

Y2 - 1 May 2005 through 5 May 2005

ER -