Abstract
This Letter reports the impact of the evaporation rate on the crystallographic phase formation of vacuum deposited α-sexithiophene thin films studied by X-ray diffraction methods. The experiments reveal the formation of two crystal phases, one of which is a thermodynamically stable phase occurring at low rates, while the second is favored by high rates. This second phase exhibits an increased layer spacing and diffraction features typical for two-dimensional crystals which are laterally ordered but without interlayer correlations of the molecular positions. This disordered layered phase comprises molecules of nonuniform conformations, and is kinetically induced.
Original language | English |
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Pages (from-to) | 51-55 |
Journal | Chemical Physics Letters |
Volume | 574 |
DOIs | |
Publication status | Published - 2013 |
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)