A Method to Determine the Permittivity of Anisotropic Thin Sheet Absorber Materials

Sajjad Sadeghi; Seyed Mostafa Mousavi; David Pommerenke

doi:10.1109/EMCEurope57790.2023.10274270

A Method to Determine the Permittivity of Anisotropic Thin Sheet Absorber Materials

Sajjad Sadeghi, Seyed Mostafa Mousavi, David Pommerenke

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

Thin sheet EMC suppression material is often manufactured in multiple layers. These artificial materials can be made by mixing metal flakes into polymers. This leads to anisotropic behavior in the electromagnetic properties of the material. This paper presents a new method for determining the anisotropic behavior of magneto-dielectric thin film materials, focusing on a measurement of both in-plane and normal-to-plane permittivity. In this procedure, the in-plane permittivity and permeability are measured using the well-known material characterization technique, and then the normal to plane permittivity is measured using the proposed technique. This method determines the value of the dielectric constant using a simple microstrip line structure. Simulation and measurement are used to verify the validity of the method.

Original language	English
Title of host publication	2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2023
Publisher	ACM/IEEE
Pages	1-6
Number of pages	6
ISBN (Electronic)	9798350324006
ISBN (Print)	979-8-3503-2401-3
DOIs	https://doi.org/10.1109/EMCEurope57790.2023.10274270
Publication status	Published - 8 Sept 2023
Event	2023 International Symposium and Exhibition on Electromagnetic Compatibility: EMC Europe 2023 - Kraków, Poland Duration: 4 Sept 2023 → 8 Sept 2023

Conference

Conference	2023 International Symposium and Exhibition on Electromagnetic Compatibility
Abbreviated title	EMC Europe 2023
Country/Territory	Poland
City	Kraków
Period	4/09/23 → 8/09/23

Keywords

Dielectric constant
Systematics
Permittivity measurement
Permeability measurement
Electromagnetic compatibility
Behavioral sciences
Microstrip
electromagnetic interference suppression
anisotropic material
electromagnetics compatibility

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/EMCEurope57790.2023.10274270

Cite this

A Method to Determine the Permittivity of Anisotropic Thin Sheet Absorber Materials. / Sadeghi, Sajjad; Mousavi, Seyed Mostafa; Pommerenke, David.
2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2023. ACM/IEEE, 2023. p. 1-6 10274270.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Sadeghi, S, Mousavi, SM & Pommerenke, D 2023, A Method to Determine the Permittivity of Anisotropic Thin Sheet Absorber Materials. in 2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2023., 10274270, ACM/IEEE, pp. 1-6, 2023 International Symposium and Exhibition on Electromagnetic Compatibility, Kraków, Poland, 4/09/23. https://doi.org/10.1109/EMCEurope57790.2023.10274270

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abstract = "Thin sheet EMC suppression material is often manufactured in multiple layers. These artificial materials can be made by mixing metal flakes into polymers. This leads to anisotropic behavior in the electromagnetic properties of the material. This paper presents a new method for determining the anisotropic behavior of magneto-dielectric thin film materials, focusing on a measurement of both in-plane and normal-to-plane permittivity. In this procedure, the in-plane permittivity and permeability are measured using the well-known material characterization technique, and then the normal to plane permittivity is measured using the proposed technique. This method determines the value of the dielectric constant using a simple microstrip line structure. Simulation and measurement are used to verify the validity of the method.",

keywords = "Dielectric constant, Systematics, Permittivity measurement, Permeability measurement, Electromagnetic compatibility, Behavioral sciences, Microstrip, electromagnetic interference suppression, anisotropic material, electromagnetics compatibility",

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N2 - Thin sheet EMC suppression material is often manufactured in multiple layers. These artificial materials can be made by mixing metal flakes into polymers. This leads to anisotropic behavior in the electromagnetic properties of the material. This paper presents a new method for determining the anisotropic behavior of magneto-dielectric thin film materials, focusing on a measurement of both in-plane and normal-to-plane permittivity. In this procedure, the in-plane permittivity and permeability are measured using the well-known material characterization technique, and then the normal to plane permittivity is measured using the proposed technique. This method determines the value of the dielectric constant using a simple microstrip line structure. Simulation and measurement are used to verify the validity of the method.

AB - Thin sheet EMC suppression material is often manufactured in multiple layers. These artificial materials can be made by mixing metal flakes into polymers. This leads to anisotropic behavior in the electromagnetic properties of the material. This paper presents a new method for determining the anisotropic behavior of magneto-dielectric thin film materials, focusing on a measurement of both in-plane and normal-to-plane permittivity. In this procedure, the in-plane permittivity and permeability are measured using the well-known material characterization technique, and then the normal to plane permittivity is measured using the proposed technique. This method determines the value of the dielectric constant using a simple microstrip line structure. Simulation and measurement are used to verify the validity of the method.

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KW - Permittivity measurement

KW - Permeability measurement

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KW - electromagnetics compatibility

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A Method to Determine the Permittivity of Anisotropic Thin Sheet Absorber Materials

Abstract

Conference

Keywords

ASJC Scopus subject areas

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