A Method to Measure the Electromagnetic Emission Induced by Electromagnetic Interference of Integrated Circuits

Daniel Kircher^*, Nikolaus Czepl, Dominik Zupan, Bernd Deutschmann

^*Corresponding author for this work

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

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A Method to Measure the Electromagnetic Emission Induced by Electromagnetic Interference of Integrated Circuits
Daniel Kircher (Speaker)
24 May 2023
Activity: Talk or presentation › Talk at conference or symposium › Science to science