A Modular Approach of an Electromagnetic Compatibility Test System for Integrated Circuits

Daniel Kircher; Bernd Deutschmann; Simon Profanter

doi:10.1109/Austrochip61217.2023.10285156

A Modular Approach of an Electromagnetic Compatibility Test System for Integrated Circuits

Daniel Kircher, Bernd Deutschmann, Simon Profanter

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

To bring automotive integrated circuits (ICs) to market, manufacturers must subject their products to numerous electromagnetic compatibility (EMC) tests such as electromagnetic immunity and emission tests, or electrostatic discharge (ESD) tests. These tests need EMC test boards that meet the specific standards’ requirements. However, the current need to increase the frequency range of EMC tests poses a challenge in designing standard-compliant test boards. In this paper, we address this issue by introducing a modular and reusable IC level EMC test system. We demonstrate the system’s effectiveness with an example of a direct power injection (DPI) test setup. It is shown how the frequency range can be expanded while minimizing costs and design efforts for the EMC test board design.

Original language	English
Title of host publication	2023 Austrochip Workshop on Microelectronics, Austrochip 2023 - Proceedings
Publisher	ACM/IEEE
Pages	19-22
Number of pages	4
ISBN (Electronic)	9798350357851
ISBN (Print)	979-8-3503-5786-8
DOIs	https://doi.org/10.1109/Austrochip61217.2023.10285156
Publication status	Published - 21 Sept 2023
Event	2023 Austrochip Workshop on Microelectronics: Austrochip 2023 - Graz, Austria Duration: 20 Sept 2023 → 21 Sept 2023

Workshop

Workshop	2023 Austrochip Workshop on Microelectronics
Abbreviated title	Austrochip 2023
Country/Territory	Austria
City	Graz
Period	20/09/23 → 21/09/23

Keywords

Electromagnetic Compatibility (EMC)
Integrated Circuit (IC)
Modular Test System
Radio Frequency (RF)
Reusable

ASJC Scopus subject areas

Safety, Risk, Reliability and Quality
Instrumentation
Electrical and Electronic Engineering
Hardware and Architecture

Access to Document

10.1109/Austrochip61217.2023.10285156

https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10285156

Cite this

Kircher, D , Deutschmann, B & Profanter, S 2023, A Modular Approach of an Electromagnetic Compatibility Test System for Integrated Circuits. in 2023 Austrochip Workshop on Microelectronics, Austrochip 2023 - Proceedings., 10285156, ACM/IEEE, pp. 19-22, 2023 Austrochip Workshop on Microelectronics, Graz, Austria, 20/09/23. https://doi.org/10.1109/Austrochip61217.2023.10285156

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N2 - To bring automotive integrated circuits (ICs) to market, manufacturers must subject their products to numerous electromagnetic compatibility (EMC) tests such as electromagnetic immunity and emission tests, or electrostatic discharge (ESD) tests. These tests need EMC test boards that meet the specific standards’ requirements. However, the current need to increase the frequency range of EMC tests poses a challenge in designing standard-compliant test boards. In this paper, we address this issue by introducing a modular and reusable IC level EMC test system. We demonstrate the system’s effectiveness with an example of a direct power injection (DPI) test setup. It is shown how the frequency range can be expanded while minimizing costs and design efforts for the EMC test board design.

AB - To bring automotive integrated circuits (ICs) to market, manufacturers must subject their products to numerous electromagnetic compatibility (EMC) tests such as electromagnetic immunity and emission tests, or electrostatic discharge (ESD) tests. These tests need EMC test boards that meet the specific standards’ requirements. However, the current need to increase the frequency range of EMC tests poses a challenge in designing standard-compliant test boards. In this paper, we address this issue by introducing a modular and reusable IC level EMC test system. We demonstrate the system’s effectiveness with an example of a direct power injection (DPI) test setup. It is shown how the frequency range can be expanded while minimizing costs and design efforts for the EMC test board design.

KW - Integrated circuits

KW - Couplings

KW - Costs

KW - Switches

KW - Immunity testing

KW - Electrostatic discharges

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BT - 2023 Austrochip Workshop on Microelectronics, Austrochip 2023 - Proceedings

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A Modular Approach of an Electromagnetic Compatibility Test System for Integrated Circuits

Abstract

Workshop

Keywords

ASJC Scopus subject areas

Access to Document

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