A new calibration method for current probes

Ramachandran Chundru*, David Pommerenke, Sunitha Chandra

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review


EMC engineers often use current probes to detect common mode currents. It is necessary to characterize the probes up to Giga Hertz frequencies. Existing calibration methods for current clamps suffer from the problem of not directly measuring the current within the current clamp. Instead they either reconstruct the current from measurements at other locations or they use assumptions regarding the geometry which allows them to use a current that is measured at a different location without applying a mathematical correction. The proposed method overcomes these disadvantages by directly measuring the current at the center of the current clamp. This paper also discusses some of the non ideal effects of current clamps.

Original languageEnglish
Pages (from-to)163-168
Number of pages6
JournalIEEE International Symposium on Electromagnetic Compatibility
Publication statusPublished - 8 Oct 2004
Externally publishedYes
Event2004 IEEE International Symposium on Electromagnetic Compatibility: EMC 2004 - Santa Clara, United States
Duration: 9 Aug 200413 Aug 2004


  • Calibration
  • Current clamp
  • Current probe
  • Transfer function
  • Transfer impedance

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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