Abstract
Using inductive current measurement technique, a new current probe is proposed that allows transient current measurement on data traces without disturbing the normal operation or transfer rate of the trace under test. The proposed probe layout, circuit model, and frequency response is discussed in detail.
Original language | English |
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Title of host publication | Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020 |
Number of pages | 8 |
ISBN (Electronic) | 978-1-7281-9461-5 |
Publication status | Published - 13 Sept 2020 |
Event | 42nd Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2020 - Reno, United States Duration: 13 Sept 2020 → 18 Sept 2020 |
Conference
Conference | 42nd Annual Electrical Overstress/Electrostatic Discharge Symposium |
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Abbreviated title | EOS/ESD 2020 |
Country/Territory | United States |
City | Reno |
Period | 13/09/20 → 18/09/20 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering