A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC

Klaus Rothbart, Ulrich Neffe, Christian Steger, Reinhold Weiß, Edgar Rieger, Andreas Mühlberger

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Digest of Papers / 6th IEEE Latin-American Test Workshop
Publisher	.
Pages	103-108
Publication status	Published - 2005
Event	IEEE Latin-American Test Workshop - Salvador, Brazil Duration: 30 Mar 2005 → 2 Apr 2005

Conference	IEEE Latin-American Test Workshop
Country/Territory	Brazil
City	Salvador
Period	30/03/05 → 2/04/05

Cite this

@inproceedings{c6883187f4eb4a558aac49df88acd6eb,

title = "A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC",

author = "Klaus Rothbart and Ulrich Neffe and Christian Steger and Reinhold Wei{\ss} and Edgar Rieger and Andreas M{\"u}hlberger",

year = "2005",

language = "English",

pages = "103--108",

booktitle = "Digest of Papers / 6th IEEE Latin-American Test Workshop",

publisher = ".",

note = "IEEE Latin-American Test Workshop ; Conference date: 30-03-2005 Through 02-04-2005",

}

TY - GEN

T1 - A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC

AU - Rothbart, Klaus

AU - Neffe, Ulrich

AU - Steger, Christian

AU - Weiß, Reinhold

AU - Rieger, Edgar

AU - Mühlberger, Andreas

PY - 2005

Y1 - 2005

UR - http://www.latw.net

M3 - Conference paper

SP - 103

EP - 108

BT - Digest of Papers / 6th IEEE Latin-American Test Workshop

PB - .

T2 - IEEE Latin-American Test Workshop

Y2 - 30 March 2005 through 2 April 2005

ER -