Aberration-Corrected STEM Characterisation of Mn-ion Structural Displacements in La0.7Sr0.3MnO3 Interfacial Dead-Layers

P. Rajak, Daniel Knez, Sandeep Kumar Chaluvadi, Pasquale Orgiani, Giorgio Rossi, Laurence Méchin, Regina Ciancio

Research output: Contribution to conferenceAbstractpeer-review

Original languageEnglish
Publication statusPublished - Sept 2022
Event16th Multinational Congress on Microscopy : 16MCM - Best Western Hotel, Brno, Czech Republic
Duration: 4 Sept 20229 Sept 2022


Conference16th Multinational Congress on Microscopy
Abbreviated title16MCM
Country/TerritoryCzech Republic

ASJC Scopus subject areas

  • General Materials Science

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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