Ability and Limit of using commercial SMT Inductors as probes for Immunity and Emissions Near field scanning

Giorgi Muchaidze, Jayong Koo, T. Li, Q. Cai, Lijun Han, J. Min, David Johannes Pommerenke

Research output: Contribution to conferencePaperpeer-review

Original languageEnglish
Publication statusPublished - 2007
Externally publishedYes
EventICONIC'2007: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging - St. Louis, United States
Duration: 27 Jun 200729 Jun 2007


Country/TerritoryUnited States
CitySt. Louis

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