Active Sampling via Tracking

Peter Roth; Horst Bischof

doi:10.1109/CVPRW.2008.4563069

Active Sampling via Tracking

Institute of Computer Graphics and Vision (7100)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of the CVPR 2008 Workshop IEEE Online Learning for Classification
Publisher	Institute of Electrical and Electronics Engineers
Pages	1-8
ISBN (Print)	978-1-4244-2339-2
DOIs	https://doi.org/10.1109/CVPRW.2008.4563069
Publication status	Published - 2008
Event	IEEE Workshop on Online Learning for Classification (OLC) - Anchorage, Alaska, United States Duration: 24 Jun 2008 → 26 Jun 2008

Conference

Conference	IEEE Workshop on Online Learning for Classification (OLC)
Country/Territory	United States
City	Anchorage, Alaska
Period	24/06/08 → 26/06/08

Treatment code (Nähere Zuordnung)

Application

Access to Document

10.1109/CVPRW.2008.4563069

AUTOVISTA - Advanced Unsupervised Monitoring and Visualization of Complex Scenarios
Lancelle, M., Roth, P. & Bischof, H.
1/04/07 → 30/09/09
Project: Research project

Cite this

@inproceedings{6a61bab1962a47ec877dfd79029eeeb8,

title = "Active Sampling via Tracking",

author = "Peter Roth and Horst Bischof",

year = "2008",

doi = "10.1109/CVPRW.2008.4563069",

language = "English",

isbn = "978-1-4244-2339-2 ",

pages = "1--8",

booktitle = "Proceedings of the CVPR 2008 Workshop IEEE Online Learning for Classification",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "IEEE Workshop on Online Learning for Classification (OLC) ; Conference date: 24-06-2008 Through 26-06-2008",

}

TY - GEN

T1 - Active Sampling via Tracking

AU - Roth, Peter

AU - Bischof, Horst

PY - 2008

Y1 - 2008

U2 - 10.1109/CVPRW.2008.4563069

DO - 10.1109/CVPRW.2008.4563069

M3 - Conference paper

SN - 978-1-4244-2339-2

SP - 1

EP - 8

BT - Proceedings of the CVPR 2008 Workshop IEEE Online Learning for Classification

PB - Institute of Electrical and Electronics Engineers

T2 - IEEE Workshop on Online Learning for Classification (OLC)

Y2 - 24 June 2008 through 26 June 2008

ER -

Active Sampling via Tracking

Conference

Treatment code (Nähere Zuordnung)

Access to Document

Projects

AUTOVISTA - Advanced Unsupervised Monitoring and Visualization of Complex Scenarios

Cite this