Adatom dynamics and the surface reconstruction of Si(110) revealed using time-resolved electron microscopy

Tom Furnival; Daniel Knez; Eric Schmidt; Rowan K. Leary; Gerald Kothleitner; Ferdinand Hofer; Paul D. Bristowe; Paul Midgley

doi:10.1063/1.5052729

Adatom dynamics and the surface reconstruction of Si(110) revealed using time-resolved electron microscopy

Tom Furnival, Daniel Knez^*, Eric Schmidt, Rowan K. Leary, Gerald Kothleitner, Ferdinand Hofer, Paul D. Bristowe, Paul Midgley^*

^*Corresponding author for this work

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to journal › Article › peer-review

Abstract

Surface dynamics lie at the heart of many areas of materials and chemical science, including heterogeneous catalysis, epitaxial growth and device fabrication. Characterizing the dynamics of surface adsorption, reactions and diﬀusion at the atomic scale is crucial to understanding and controlling such processes. Here we use aberration-corrected scanning transmission electron microscopy to analyze the diﬀusive behavior of Pt atoms adsorbed on the Si(110) surface, and characterize the eﬀects of the electron beam on adatom motion, including a bias introduced by the raster scan of the probe. We further observe the evolution of the Si(110) surface, revealing evidence of developing surface steps attributed to the 16×2 surface reconstruction. These results demonstrate a framework for studying complex atomic-scale surface dynamics using aberration-corrected electron microscopy.

Original language	English
Pages (from-to)	183104
Journal	Applied Physics Letters
Volume	113
Issue number	18
DOIs	https://doi.org/10.1063/1.5052729
Publication status	Published - 2018

Keywords

Atom surface interaction
transmission electron microscopy (TEM)
Machine Learning
surface modification and engineering

Fields of Expertise

Advanced Materials Science

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PaperAccepted author manuscript, 9.13 MBLicence: CC BY-NC 4.0

Cite this

@article{02644010e8334784a522a04841cd30e2,

title = "Adatom dynamics and the surface reconstruction of Si(110) revealed using time-resolved electron microscopy",

abstract = "Surface dynamics lie at the heart of many areas of materials and chemical science, including heterogeneous catalysis, epitaxial growth and device fabrication. Characterizing the dynamics of surface adsorption, reactions and diﬀusion at the atomic scale is crucial to understanding and controlling such processes. Here we use aberration-corrected scanning transmission electron microscopy to analyze the diﬀusive behavior of Pt atoms adsorbed on the Si(110) surface, and characterize the eﬀects of the electron beam on adatom motion, including a bias introduced by the raster scan of the probe. We further observe the evolution of the Si(110) surface, revealing evidence of developing surface steps attributed to the 16×2 surface reconstruction. These results demonstrate a framework for studying complex atomic-scale surface dynamics using aberration-corrected electron microscopy.",

keywords = "Atom surface interaction, transmission electron microscopy (TEM), Machine Learning, surface modification and engineering",

author = "Tom Furnival and Daniel Knez and Eric Schmidt and Leary, {Rowan K.} and Gerald Kothleitner and Ferdinand Hofer and Bristowe, {Paul D.} and Paul Midgley",

year = "2018",

doi = "10.1063/1.5052729",

language = "English",

volume = "113",

pages = "183104",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "18",

}

TY - JOUR

T1 - Adatom dynamics and the surface reconstruction of Si(110) revealed using time-resolved electron microscopy

AU - Furnival, Tom

AU - Knez, Daniel

AU - Schmidt, Eric

AU - Leary, Rowan K.

AU - Kothleitner, Gerald

AU - Hofer, Ferdinand

AU - Bristowe, Paul D.

AU - Midgley, Paul

PY - 2018

Y1 - 2018

N2 - Surface dynamics lie at the heart of many areas of materials and chemical science, including heterogeneous catalysis, epitaxial growth and device fabrication. Characterizing the dynamics of surface adsorption, reactions and diﬀusion at the atomic scale is crucial to understanding and controlling such processes. Here we use aberration-corrected scanning transmission electron microscopy to analyze the diﬀusive behavior of Pt atoms adsorbed on the Si(110) surface, and characterize the eﬀects of the electron beam on adatom motion, including a bias introduced by the raster scan of the probe. We further observe the evolution of the Si(110) surface, revealing evidence of developing surface steps attributed to the 16×2 surface reconstruction. These results demonstrate a framework for studying complex atomic-scale surface dynamics using aberration-corrected electron microscopy.

AB - Surface dynamics lie at the heart of many areas of materials and chemical science, including heterogeneous catalysis, epitaxial growth and device fabrication. Characterizing the dynamics of surface adsorption, reactions and diﬀusion at the atomic scale is crucial to understanding and controlling such processes. Here we use aberration-corrected scanning transmission electron microscopy to analyze the diﬀusive behavior of Pt atoms adsorbed on the Si(110) surface, and characterize the eﬀects of the electron beam on adatom motion, including a bias introduced by the raster scan of the probe. We further observe the evolution of the Si(110) surface, revealing evidence of developing surface steps attributed to the 16×2 surface reconstruction. These results demonstrate a framework for studying complex atomic-scale surface dynamics using aberration-corrected electron microscopy.

KW - Atom surface interaction

KW - transmission electron microscopy (TEM)

KW - Machine Learning

KW - surface modification and engineering

U2 - 10.1063/1.5052729

DO - 10.1063/1.5052729

M3 - Article

SN - 0003-6951

VL - 113

SP - 183104

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 18

ER -

Adatom dynamics and the surface reconstruction of Si(110) revealed using time-resolved electron microscopy

Abstract

Keywords

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