Alignability equivalence of synchronous sequential circuits

Amnon Rosenmann, Ziyad Hanna

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationSeventh IEEE International High-Level Design Validation and Test Workshop 2002, Cannes, France
Pages111-114
DOIs
Publication statusPublished - 2002

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