An Accurate De-embedding and Characterization Methodology for Dual-Band HF/UHF RFID Chips and Antennas

Hossein Sarbandifarahani*, Behrooz Rezaee, Michael Ernst Gadringer, Lukas Zöscher, Franz Amtmann, Wolfgang Bösch

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


In this paper, we describe two characterization methodologies for dual-band HF/UHF RFIC chips and antennas with single and differential-ended port configurations. Test fixtures and de-embedding techniques are used to achieve an accurate and robust impedance characterization of an RFID chip and a corresponding antenna. The multiline TRL (thru-reflect-line) de-embedding technique is employed to eliminate the unwanted behavior of the test fixtures from the measured response. In addition, a new mode transition from differential ground-less coupled line to single-ended line is introduced to characterizing the input impedance of the UHF antenna. The simulation and measurement results are in good agreement and demonstrate the accuracy of the proposed method.

Original languageEnglish
Title of host publication15th European Conference on Antennas and Propagation, EuCAP 2021
ISBN (Electronic)9788831299022
Publication statusPublished - 22 Mar 2021
Event15th European Conference on Antennas and Propagation: EucAP 2021 - Virtuell, Düsseldorf, Germany
Duration: 22 Mar 202126 Mar 2021

Publication series

Name15th European Conference on Antennas and Propagation, EuCAP 2021


Conference15th European Conference on Antennas and Propagation
Abbreviated titleEucAP 2021
CityVirtuell, Düsseldorf


  • De-embedding fixture
  • HF/UHF RFID antenna
  • HF/UHF RFID chip
  • multiline-TRL

ASJC Scopus subject areas

  • Signal Processing
  • Instrumentation
  • Computer Networks and Communications

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Experimental

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