@inproceedings{507cb43683f34ad5925093ae61633ac0,
title = "An application of system level efficient ESD design for high- speed USB3.x interface",
abstract = "A high-speed USB3.x IO is analyzed using the System level efficient ESD design methodology [1] using on-board current and voltage measurements for the TX and RX pins. The interactions between external ESD protection device and the on-chip ESD protection circuit is investigated in measurement and simulation.",
author = "Pengyu Wei and Giorgi Maghlakelidze and Jianchi Zhou and Harald Gossner and David Pommerenke",
year = "2018",
month = oct,
day = "25",
language = "English",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018",
note = "40th Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 2018 ; Conference date: 23-09-2018 Through 28-09-2018",
}