Analytical Characterization for NIL Production of Organic TFTs by EFTEM

Thomas Haber; C. Auner; U. Palfinger; Meltem Sezen; Werner Grogger

doi:10.3217/978-3-85125-062-6-575

Analytical Characterization for NIL Production of Organic TFTs by EFTEM

Thomas Haber, C. Auner, U. Palfinger, Meltem Sezen, Werner Grogger

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Materials Science
Place of Publication	Wien
Publisher	Facultas
Pages	405-406
ISBN (Print)	978-3-85125-062-6
DOIs	https://doi.org/10.3217/978-3-85125-062-6-575
Publication status	Published - 2009
Event	Multinational Congress on Microscopy - Graz, Austria Duration: 30 Aug 2009 → 4 Sept 2009

Conference

Conference	Multinational Congress on Microscopy
Country/Territory	Austria
City	Graz
Period	30/08/09 → 4/09/09

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Access to Document

10.3217/978-3-85125-062-6-575

Crystal structure analysis using electron microscopy
1/01/02 → …
Project: Research area

Cite this

@inproceedings{65e3dfc4e83c435799ed76a743951e50,

title = "Analytical Characterization for NIL Production of Organic TFTs by EFTEM",

author = "Thomas Haber and C. Auner and U. Palfinger and Meltem Sezen and Werner Grogger",

year = "2009",

doi = "10.3217/978-3-85125-062-6-575",

language = "English",

isbn = "978-3-85125-062-6",

pages = "405--406",

booktitle = "Materials Science",

publisher = "Facultas",

note = "Multinational Congress on Microscopy ; Conference date: 30-08-2009 Through 04-09-2009",

}

TY - GEN

T1 - Analytical Characterization for NIL Production of Organic TFTs by EFTEM

AU - Haber, Thomas

AU - Auner, C.

AU - Palfinger, U.

AU - Sezen, Meltem

AU - Grogger, Werner

PY - 2009

Y1 - 2009

U2 - 10.3217/978-3-85125-062-6-575

DO - 10.3217/978-3-85125-062-6-575

M3 - Conference paper

SN - 978-3-85125-062-6

SP - 405

EP - 406

BT - Materials Science

PB - Facultas

CY - Wien

T2 - Multinational Congress on Microscopy

Y2 - 30 August 2009 through 4 September 2009

ER -

Analytical Characterization for NIL Production of Organic TFTs by EFTEM

Conference

Treatment code (Nähere Zuordnung)

Access to Document

Projects

Crystal structure analysis using electron microscopy

Cite this