Applying CT-FLA for AEB Function Testing: A Virtual Driving Case Study

Ludwig Kampel, Michael Wagner, Dimitris E. Simos, Mihai Nica, Dino Dodig, David Kaufmann, Franz Wotawa

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

The advancements of automated and autonomous vehicles requires virtual verification and validation of automated driving functions, in order to provide necessary safety levels and to increase acceptance of such systems. The aim of our work is to investigate the feasibility of combinatorial testing fault localization (CT-FLA) in the domain of virtual driving function testing. We apply CT-FLA to screen parameter settings that lead to critical driving scenarios in a virtual verification and validation framework used for automated driving function testing. Our first results indicate that CT-FLA methods can help to identify parameter-value combinations leading to crash scenarios.

Original languageEnglish
Title of host publicationProceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023
PublisherIEEE
Pages237-245
Number of pages9
ISBN (Electronic)9798350333350
DOIs
Publication statusPublished - 2023
Event16th IEEE International Conference on Software Testing, Verification and Validation Workshops: ICSTW 2023 - Dublin, Ireland
Duration: 16 Apr 202320 Apr 2023

Conference

Conference16th IEEE International Conference on Software Testing, Verification and Validation Workshops
Abbreviated titleICSTW 2023
Country/TerritoryIreland
CityDublin
Period16/04/2320/04/23

Keywords

  • AEB
  • autonomous driving
  • Combinatorial fault localization
  • Combinatorial testing
  • test scenario generation

ASJC Scopus subject areas

  • Software
  • Safety, Risk, Reliability and Quality
  • Modelling and Simulation

Fingerprint

Dive into the research topics of 'Applying CT-FLA for AEB Function Testing: A Virtual Driving Case Study'. Together they form a unique fingerprint.

Cite this