Bmodel of secondary ESD for a portable product

Jiang Xiao*, David Pommerenke, James L. Drewniak, Hideki Shumiya, Takashi Yamada, Kenji Araki

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


If a non grounded piece of metal is subjected to an ESD, a spark between this metal part and grounded metal parts can occur. This discharge is generally called secondary ESD. These secondary ESDs are often very close to the electronics and, as this article shows, can have much higher currents and shorter rise times than the original ESD. For that reason secondary ESD poses a very high risk of causing soft-and hard errors in the affected Device Under Test (DUT). A methodology to model the secondary Electrostatic Discharge (ESD) inside a portable electronic product is presented. It is a hybrid method that combines linear descriptions of the ESD generator and the DUT with the nonlinear spark model and a model for the initiation delay (statistical time lag) of the spark. Measurement results are presented comparing discharge currents and time delays for two cases: secondary discharge between metal rod and ESD target, and inside a portable product.

Original languageEnglish
Title of host publicationEMC 2011 - Proceedings
Subtitle of host publication2011 IEEE International Symposium on Electromagnetic Compatibility
Number of pages6
Publication statusPublished - 24 Oct 2011
Externally publishedYes
Event2011 IEEE International Symposium on Electromagnetic Compatibility: EMC 2011 - Long Beach, United States
Duration: 14 Aug 201119 Aug 2011

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076


Conference2011 IEEE International Symposium on Electromagnetic Compatibility
Country/TerritoryUnited States
CityLong Beach


  • Co-simulation
  • Electrostatic discharge (ESD) generator
  • Full wave modeling
  • Secondary electrostatic discharge

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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