Characterization of Ni-Pt-O Microstructures by Analytical Electron Microscopy

Irmgard Rom; A. Schröder; Ferdinand Hofer; Werner Sitte; Werner Grogger

Characterization of Ni-Pt-O Microstructures by Analytical Electron Microscopy

Irmgard Rom, A. Schröder, Ferdinand Hofer, Werner Sitte, Werner Grogger

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Mass and Charge Transport in Inorganic Materials
Place of Publication	Faenza
Publisher	Techna
Pages	621-626
Volume	29
ISBN (Print)	88-86538-30-8
Publication status	Published - 2000
Event	International Conference on Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices - Venezia, Italy Duration: 28 May 2000 → 2 Jun 2000

Publication series

Name	Advances in science and technology
Publisher	Techna

Conference

Conference	International Conference on Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices
Country/Territory	Italy
City	Venezia
Period	28/05/00 → 2/06/00

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Cite this

Rom, I, Schröder, A, Hofer, F , Sitte, W & Grogger, W 2000, Characterization of Ni-Pt-O Microstructures by Analytical Electron Microscopy. in Mass and Charge Transport in Inorganic Materials. vol. 29, Advances in science and technology, Techna, Faenza, pp. 621-626, International Conference on Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices, Venezia, Italy, 28/05/00.

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title = "Characterization of Ni-Pt-O Microstructures by Analytical Electron Microscopy",

author = "Irmgard Rom and A. Schr{\"o}der and Ferdinand Hofer and Werner Sitte and Werner Grogger",

year = "2000",

language = "English",

isbn = "88-86538-30-8",

volume = "29",

series = "Advances in science and technology",

publisher = "Techna",

pages = "621--626",

booktitle = "Mass and Charge Transport in Inorganic Materials",

note = "International Conference on Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices ; Conference date: 28-05-2000 Through 02-06-2000",

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TY - GEN

T1 - Characterization of Ni-Pt-O Microstructures by Analytical Electron Microscopy

AU - Rom, Irmgard

AU - Schröder, A.

AU - Hofer, Ferdinand

AU - Sitte, Werner

AU - Grogger, Werner

PY - 2000

Y1 - 2000

M3 - Conference paper

SN - 88-86538-30-8

VL - 29

T3 - Advances in science and technology

SP - 621

EP - 626

BT - Mass and Charge Transport in Inorganic Materials

PB - Techna

CY - Faenza

T2 - International Conference on Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices

Y2 - 28 May 2000 through 2 June 2000

ER -