Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	European Test Workshop
Place of Publication	Los Alamitos, Calif.
Publisher	IEEE Computer Soc.
Pages	132-137
ISBN (Print)	0-7695-1908-3
DOIs	https://doi.org/10.1109/ETW.2003.1231680
Publication status	Published - 2003
Event	European Test Workshop - Maastricht, Netherlands Duration: 25 May 2003 → 28 May 2003

Fields of Expertise

@inproceedings{dc7d5df2c86e42a38309015f8efb65b4,

title = "Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967",

author = "Timm Ostermann and Bernd Deutschmann",

year = "2003",

doi = "10.1109/ETW.2003.1231680",

language = "English",

isbn = "0-7695-1908-3",

pages = "132--137",

booktitle = "European Test Workshop",

publisher = "IEEE Computer Soc.",

note = "European Test Workshop ; Conference date: 25-05-2003 Through 28-05-2003",

}

TY - GEN

T1 - Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967

AU - Ostermann, Timm

AU - Deutschmann, Bernd

PY - 2003

Y1 - 2003

U2 - 10.1109/ETW.2003.1231680

DO - 10.1109/ETW.2003.1231680

M3 - Conference paper

SN - 0-7695-1908-3

SP - 132

EP - 137

BT - European Test Workshop

PB - IEEE Computer Soc.

CY - Los Alamitos, Calif.

T2 - European Test Workshop

Y2 - 25 May 2003 through 28 May 2003

ER -