Characterizing ESD stress currents in human wearable devices

Abhishek Patnaik, Runbing Hua, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


Currents induced on an I/O of a human wearable device IC are predicted using a test IC as a wearable device capable of transient event detection and level sensing. ESD on this pseudo wearable device using the test IC is characterized for different test scenarios and compared to the prediction.

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017
PublisherESD Association
ISBN (Electronic)1585372935
Publication statusPublished - 18 Oct 2017
Externally publishedYes
Event39th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2017 - Tucson, United States
Duration: 10 Sept 201714 Sept 2017

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159


Conference39th Annual Electrical Overstress/Electrostatic Discharge Symposium
Country/TerritoryUnited States

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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