Charge Trapping by Self-Assembled Monolayers as the Origin of the Threshold Voltage Shift in Organic Field-Effect Transistors

Fatemeh Gholamrezaie, Anne-Marije Andringa, Alfred Neuhold, W. S. Christian Roelofs, Martijn Kemerink, Paul W. M. Blom, Dago M. de Leeuw

Research output: Contribution to journalArticlepeer-review

Original languageGerman
Pages (from-to)241-245
Issue number2
Publication statusPublished - 2011

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Experimental
  • Basic - Fundamental (Grundlagenforschung)

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