Vergleichende EMV-Untersuchungen auf Geräte- und IC-Ebene

Translated title of the contribution: Comparative EMC-investigations on electronic system level and IC-level

Kurt Lamedschwandner, Bernd Deutschmann, Gunter Winkler, Timm Ostermann

Research output: Contribution to journalArticlepeer-review

Abstract

In modern electronic system design integrated circuits (ICs) can be the source for potential EMC problems. They are often the reason, why an electronic device does not meet the regulatory requirements. Therefore electronic device designers demand for ICs with "good" EMC performance. However, EMC assessment on system level and on IC level uses different methods. It is not easy to say, in which way a forecast of the EMC behavior for an application is possible on the basis of EMC measurement results at IC level. This article is a contribution in order to fill this gap.
Translated title of the contributionComparative EMC-investigations on electronic system level and IC-level
Original languageGerman
Pages (from-to)9-14
JournalElektrotechnik und Informationstechnik
Volume123
Issue number1-2
DOIs
Publication statusPublished - 2006

Fields of Expertise

  • Sonstiges

Treatment code (Nähere Zuordnung)

  • Experimental
  • Basic - Fundamental (Grundlagenforschung)

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