Coordinate measurement with nano-metric resolution from multiple SEM images

Reinhard Danzl, Hartmuth Schröttner, Stefan Scherer, Franz Helmli

Research output: Contribution to conference › Poster

Original languageEnglish
Publication statusPublished - 2012
EventEuropean Microscopy Congress - Manchester
Duration: 16 Sept 2012 → 21 Sept 2012

Conference

ConferenceEuropean Microscopy Congress
CityManchester
Period16/09/12 → 21/09/12

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Application
  • Theoretical
  • Experimental

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