Correlation between sputter deposition parameters and I-V characteristics in double-barrier memristive devices

Finn Zahari, Felix Schichting, Julian Strobel, Sven Dirkmann, Julia Cipo, Sven Gauter, Jan Trieschmann, Richard Marquardt, Georg Haberfehlner, Gerald Kothleitner, Lorenz Kienle, Thomas Mussenbrock, Martin Ziegler, Holger Kersten, Hermann Kohlstedt

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)061203
Number of pages11
JournalJournal of Vacuum Science and Technology B. Nanotechnology & Microelectronics
Issue number37
Publication statusPublished - 2019

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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