Correlative SEM, EDX and Raman microscopy of corrosive stressed components - In particular microbial corrosion (MIC), chloride induced corrosion (CIC) and alkali silica reaction (AKR)

Thomas Planko, Harald Matthias Fitzek, Stefanie Eichinger, Johannes Rattenberger, Günther Koraimann, H. Zeitlhofer, M. Peyerl, Hartmuth Schröttner

Research output: Contribution to conference › Poster

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Material Science