Abstract
This paper describes a 16 × 16 pixels CdTe-based X-ray detector named dimension 2 revision 1 (D2R1) with a pixel size of 300 μ m × 300 μ m. An application-specific integrated circuit (ASIC) is interconnected to a CdTe detector by means of an indium gold stud bonding process. This ASIC has a mean equivalent noise charge of 29 el.rms (at 0 pF). The combination of a low capacitance interconnection and low-dark-current detector (0.5 pA) with an optimized ASIC results in a spectral resolution of 584-eV full-width at half-maximum at 60 keV, an energy threshold of 2 keV with a dynamic range of 250 keV. A filtering stage made of a multicorrelated double sampling allows the system to measure X-ray photons at a frequency of 10 kcounts/s typically suited for low photon flux less than 3000 photons cm-2 s-1. The energy range, resolution, and timing capability of D2R1 can suite a variety of different applications such as X-ray astrophysics, nuclear safety, or medical applications.
Original language | English |
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Pages (from-to) | 1408-1415 |
Number of pages | 8 |
Journal | IEEE Transactions on Nuclear Science |
Volume | 65 |
Issue number | 7 |
DOIs | |
Publication status | Published - 1 Jul 2018 |
Keywords
- Application-specific integrated circuits (ASICs)
- CdTe
- energy resolution
- imaging
- low-noise electronics
- spectroscopy
- X-rays
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Electrical and Electronic Engineering