Determination of crystallite size and lattice strain in hexaphenyl thin films by line profile analysis

H. - J. Brandt, Roland Resel, J. Keckes, B. Koppelhuber-Bitschnau, N. Koch, Günther Leising

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)161-166
JournalMaterials Research Society Symposium Proceedings
Publication statusPublished - 1999

Treatment code (Nähere Zuordnung)

  • Experimental

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