Direct-Write Fabrication of Electric and Thermal High-Resolution Nano-Probes on Self-Sensing AFM Cantilever

Jürgen Sattelkow; Johannes Fröch; Robert Winkler; C. Schwalb; M. Winhold; A. Deutschinger; T. Strunz; E.J. Fantner; V. Stavrov; Harald Plank

Direct-Write Fabrication of Electric and Thermal High-Resolution Nano-Probes on Self-Sensing AFM Cantilever

Jürgen Sattelkow, Johannes Fröch, Robert Winkler, C. Schwalb, M. Winhold, A. Deutschinger, T. Strunz, E.J. Fantner, V. Stavrov, Harald Plank

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Book of Abstracts
Pages	68-69
Publication status	Published - 2018
Event	7th International Workshop on Focused Electron Beam Induced Processing - Modena, Modena, Italy Duration: 10 Jul 2018 → 13 Jul 2018 http://febip.org/

Conference

Conference	7th International Workshop on Focused Electron Beam Induced Processing
Abbreviated title	FEBIP 2018
Country/Territory	Italy
City	Modena
Period	10/07/18 → 13/07/18
Internet address	http://febip.org/

ASJC Scopus subject areas

General Materials Science

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Cite this

@inproceedings{2c61e24ad35649c78ca544ec46e63211,

title = "Direct-Write Fabrication of Electric and Thermal High-Resolution Nano-Probes on Self-Sensing AFM Cantilever",

author = "J{\"u}rgen Sattelkow and Johannes Fr{\"o}ch and Robert Winkler and C. Schwalb and M. Winhold and A. Deutschinger and T. Strunz and E.J. Fantner and V. Stavrov and Harald Plank",

year = "2018",

language = "English",

pages = "68--69",

booktitle = "Book of Abstracts",

note = "7th International Workshop on Focused Electron Beam Induced Processing, FEBIP 2018 ; Conference date: 10-07-2018 Through 13-07-2018",

url = "http://febip.org/",

}

TY - GEN

T1 - Direct-Write Fabrication of Electric and Thermal High-Resolution Nano-Probes on Self-Sensing AFM Cantilever

AU - Sattelkow, Jürgen

AU - Fröch, Johannes

AU - Winkler, Robert

AU - Schwalb, C.

AU - Winhold, M.

AU - Deutschinger, A.

AU - Strunz, T.

AU - Fantner, E.J.

AU - Stavrov, V.

AU - Plank, Harald

PY - 2018

Y1 - 2018

M3 - Conference paper

SP - 68

EP - 69

BT - Book of Abstracts

T2 - 7th International Workshop on Focused Electron Beam Induced Processing

Y2 - 10 July 2018 through 13 July 2018

ER -