DualBeam FIB application of 3D EDXS for superalloy δ-phase characterization

Julian Wagner, Miroslava Schaffer, Hartmuth Schröttner, Stefan Mitsche, Ilse Letofsky-Papst, Ch. Stotter, Christof Sommitsch

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationEuropean Microscopy Congress
Place of PublicationBerlin
PublisherSpringer
Pages687-688
VolumeVolume1
ISBN (Print)978-3-540-85154-7
Publication statusPublished - 2008
EventEuropean Microscopy Congress - Aachen, Germany
Duration: 1 Sept 20085 Sept 2008

Publication series

NameInstrumentation and Methods
PublisherSpringer

Conference

ConferenceEuropean Microscopy Congress
Country/TerritoryGermany
CityAachen
Period1/09/085/09/08

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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