EDX quantification in the TEM: How to measure ζ-factors without knowing the sample thickness

Research output: Contribution to conference › Poster › peer-review

Original language	English
Publication status	Published - 2020
Event	Virtual Early Career European Microscopy Congress 2020: EMC 2020 - Virtuell, United Kingdom Duration: 24 Nov 2020 → 26 Nov 2020 https://www.emc2020.eu/virtual-conference/conference-programme.html

Conference	Virtual Early Career European Microscopy Congress 2020
Abbreviated title	EMC 2020
Country/Territory	United Kingdom
Period	24/11/20 → 26/11/20
Internet address	https://www.emc2020.eu/virtual-conference/conference-programme.html

ASJC Scopus subject areas

@conference{9ae41ec2f7d44e29974a05be6961282f,

title = "EDX quantification in the TEM: How to measure ζ-factors without knowing the sample thickness",

author = "Nikolaus Rauch and Judith Lammer and Sebastian Rauch and Martina Dienstleder and Werner Grogger",

year = "2020",

language = "English",

note = "Virtual Early Career European Microscopy Congress 2020 : EMC 2020, EMC 2020 ; Conference date: 24-11-2020 Through 26-11-2020",

url = "https://www.emc2020.eu/virtual-conference/conference-programme.html",

}