EELS Detection Limits Revisted

Katharina Riegler, Gerald Kothleitner

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to conference › Poster

Original language	English
Publication status	Published - 2009
Event	EDGE 2009 - Banff, Kanada Duration: 18 May 2009 → 22 May 2009

Conference

Conference	EDGE 2009
City	Banff, Kanada
Period	18/05/09 → 22/05/09

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Nanoanalysis using transmission electron microscopy
1/01/04 → 31/12/24
Project: Research area

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