EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates

Boriana Raskova; Saso Sturm; Z. Zhang; Gerald Kothleitner; Kerstin Kutschej; Christian Mitterer; Petr Lazar; Josef Redinger; Raimund Poldloucky; Christina Scheu; Gerhard Dehm

doi:10.3217/978-3-85125-062-6-515

EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates

Boriana Raskova, Saso Sturm, Z. Zhang, Gerald Kothleitner, Kerstin Kutschej, Christian Mitterer, Petr Lazar, Josef Redinger, Raimund Poldloucky, Christina Scheu, Gerhard Dehm

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Materials Science
Place of Publication	Wien
Publisher	Facultas
Pages	285-286
ISBN (Print)	978-3-85125-062-6
DOIs	https://doi.org/10.3217/978-3-85125-062-6-515
Publication status	Published - 2009
Event	Multinational Congress on Microscopy - Graz, Austria Duration: 30 Aug 2009 → 4 Sept 2009

Conference

Conference	Multinational Congress on Microscopy
Country/Territory	Austria
City	Graz
Period	30/08/09 → 4/09/09

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Access to Document

10.3217/978-3-85125-062-6-515

Nanoanalysis using transmission electron microscopy
1/01/04 → 31/12/24
Project: Research area

Cite this

Raskova, B, Sturm, S, Zhang, Z, Kothleitner, G, Kutschej, K, Mitterer, C, Lazar, P, Redinger, J, Poldloucky, R, Scheu, C & Dehm, G 2009, EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates. in Materials Science. Facultas, Wien, pp. 285-286, Multinational Congress on Microscopy, Graz, Austria, 30/08/09. https://doi.org/10.3217/978-3-85125-062-6-515

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title = "EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates",

author = "Boriana Raskova and Saso Sturm and Z. Zhang and Gerald Kothleitner and Kerstin Kutschej and Christian Mitterer and Petr Lazar and Josef Redinger and Raimund Poldloucky and Christina Scheu and Gerhard Dehm",

year = "2009",

doi = "10.3217/978-3-85125-062-6-515",

language = "English",

isbn = "978-3-85125-062-6",

pages = "285--286",

booktitle = "Materials Science",

publisher = "Facultas",

note = "Multinational Congress on Microscopy ; Conference date: 30-08-2009 Through 04-09-2009",

}

TY - GEN

T1 - EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates

AU - Raskova, Boriana

AU - Sturm, Saso

AU - Zhang, Z.

AU - Kothleitner, Gerald

AU - Kutschej, Kerstin

AU - Mitterer, Christian

AU - Lazar, Petr

AU - Redinger, Josef

AU - Poldloucky, Raimund

AU - Scheu, Christina

AU - Dehm, Gerhard

PY - 2009

Y1 - 2009

U2 - 10.3217/978-3-85125-062-6-515

DO - 10.3217/978-3-85125-062-6-515

M3 - Conference paper

SN - 978-3-85125-062-6

SP - 285

EP - 286

BT - Materials Science

PB - Facultas

CY - Wien

T2 - Multinational Congress on Microscopy

Y2 - 30 August 2009 through 4 September 2009

ER -

EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates

Conference

Treatment code (Nähere Zuordnung)

Access to Document

Projects

Nanoanalysis using transmission electron microscopy

Cite this