Effects of ionic traces within the semiconductor and/or the dielectric on the operational characteristics of organic field-effect transistors

Andreas Klug, Kerstin Schmoltner, Sonja Larissegger, Emil List

Research output: Contribution to conference(Old data) Lecture or Presentation

Original languageEnglish
Publication statusPublished - 13 May 2012
EventEuropean Materials Research Society Spring Meeting 2012: E-MRS Spring Meeting 2012 - Strasbourg, France
Duration: 13 May 201218 May 2012


ConferenceEuropean Materials Research Society Spring Meeting 2012
Abbreviated titleEMRS Spring Meeting 2012

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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