Abstract
In this paper, we analyse the impact of ionising radiation on the conducted electromagnetic immunity of integrated circuits (ICs). We use the direct power injection (DPI) method according to IEC 62132-4 to characterize the conducted electromagnetic immunity of our test IC at the VDD pin. In addition to measuring the electromagnetic immunity, we irradiate the IC with X-rays. The irradiation process is carried out up to a dose of 1.5Mrad using a high power X-ray radiation source. The electromagnetic immunity characteristic of the IC is determined for the unirradiated IC and for doses of 0.5Mrad, 1.0Mrad and 1.5Mrad. We present measurement results demonstrating a low but significant impact of ionising radiation on the conducted electromagnetic immunity behaviour of our test IC. With increasing radiation dose, our IC is getting more robust towards radio frequency interference (RFI) at the VDD pin.
Original language | English |
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Title of host publication | 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal and Power Integrity |
Subtitle of host publication | EMC Japan/Asia Pacific International Symposium on Electromagnetic Compatibility, EMC Japan/APEMC Okinawa 2024 - Proceedings |
Publisher | IEEE |
Pages | 609-612 |
Number of pages | 4 |
ISBN (Electronic) | 9784885523472 |
DOIs | |
Publication status | Published - 2024 |
Event | 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal and Power Integrity: EMC Japan/Asia Pacific International Symposium on Electromagnetic Compatibility: EMC Japan/APEMC Okinawa 2024 - Okinawa, Japan Duration: 20 May 2024 → 24 May 2024 |
Conference
Conference | 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal and Power Integrity: EMC Japan/Asia Pacific International Symposium on Electromagnetic Compatibility |
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Country/Territory | Japan |
City | Okinawa |
Period | 20/05/24 → 24/05/24 |
Keywords
- Combined EMC testing
- Electromagnetic Compatibility (EMC)
- Electromagnetic Immunity
- IEC 62132
- Radiation Hardness
ASJC Scopus subject areas
- Hardware and Architecture
- Signal Processing
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
- Radiation