Effects of Ionising Radiation on the Electromagnetic Immunity Behaviour of Integrated Circuits

Nikolaus Czepl*, Daniel Kircher, Bernd Deutschmann

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

In this paper, we analyse the impact of ionising radiation on the conducted electromagnetic immunity of integrated circuits (ICs). We use the direct power injection (DPI) method according to IEC 62132-4 to characterize the conducted electromagnetic immunity of our test IC at the VDD pin. In addition to measuring the electromagnetic immunity, we irradiate the IC with X-rays. The irradiation process is carried out up to a dose of 1.5Mrad using a high power X-ray radiation source. The electromagnetic immunity characteristic of the IC is determined for the unirradiated IC and for doses of 0.5Mrad, 1.0Mrad and 1.5Mrad. We present measurement results demonstrating a low but significant impact of ionising radiation on the conducted electromagnetic immunity behaviour of our test IC. With increasing radiation dose, our IC is getting more robust towards radio frequency interference (RFI) at the VDD pin.

Original languageEnglish
Title of host publication2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal and Power Integrity
Subtitle of host publicationEMC Japan/Asia Pacific International Symposium on Electromagnetic Compatibility, EMC Japan/APEMC Okinawa 2024 - Proceedings
PublisherIEEE
Pages609-612
Number of pages4
ISBN (Electronic)9784885523472
DOIs
Publication statusPublished - 2024
Event2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal and Power Integrity: EMC Japan/Asia Pacific International Symposium on Electromagnetic Compatibility: EMC Japan/APEMC Okinawa 2024 - Okinawa, Japan
Duration: 20 May 202424 May 2024

Conference

Conference2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal and Power Integrity: EMC Japan/Asia Pacific International Symposium on Electromagnetic Compatibility
Country/TerritoryJapan
CityOkinawa
Period20/05/2424/05/24

Keywords

  • Combined EMC testing
  • Electromagnetic Compatibility (EMC)
  • Electromagnetic Immunity
  • IEC 62132
  • Radiation Hardness

ASJC Scopus subject areas

  • Hardware and Architecture
  • Signal Processing
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation

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