Abstract
In this article, we show the change of electromagnetic emission (EME) of integrated circuits (ICs) and their external circuitry induced by the presence of ionizing radiation. We use the 150 Ohm method according to IEC 61967‑4 to characterize the conducted emission of our tested integrated circuit (IC) at the VDD pin. Simultaneously to measuring the electromagnetic emission, we irradiate the IC with X‑rays. The irradiation process is carried out up to a dose of 5 Mrad using a high-power X‑ray radiation source. The electromagnetic emission spectra are retrieved before, during and after the irradiation process. We also show that special caution regarding radio frequency (RF) measurements must be used when performing combined testing. Therefore, we analyze the composition of measurement uncertainties of electromagnetic compatibility in combination with ionizing radiation hardness characterization. This article contains measurement results showing the negative impact of ionizing radiation on the electromagnetic compatibility (EMC) of an IC. Additionally we provide measures to ensure properly combined measurements of EME and ionizing radiation. Therefore we show how to reduce the electromagnetic interference originating from the high-voltage generator that is necessary to generate X‑rays.
| Translated title of the contribution | Elektromagnetische Störemission von integrierten Schaltkreisen verursacht durch ionisierende Strahlung sowie die Bestimmung der Messunsicherheiten |
|---|---|
| Original language | English |
| Pages (from-to) | 56-65 |
| Number of pages | 10 |
| Journal | Elektrotechnik und Informationstechnik |
| Volume | 141 |
| Issue number | 1 |
| Early online date | 17 Jan 2024 |
| DOIs | |
| Publication status | Published - Mar 2024 |
Keywords
- Combined EMC testing
- Electromagnetic Compatibility (EMC)
- Electromagnetic Emission (EM)
- IEC 61967
- Radiation hardness
ASJC Scopus subject areas
- Electrical and Electronic Engineering