Original language | English |
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Publication status | Published - Apr 2017 |
Event | Conference on Frontiers of Aberration Corrected Electron Microscopy - Kasteel Vaalsbroek, Netherlands Duration: 30 Apr 2017 → 4 May 2017 Conference number: 4 |
Conference
Conference | Conference on Frontiers of Aberration Corrected Electron Microscopy |
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Abbreviated title | PICO 2017 |
Country/Territory | Netherlands |
City | Kasteel Vaalsbroek |
Period | 30/04/17 → 4/05/17 |
Fields of Expertise
- Advanced Materials Science