EMI mitigation with lossy material at 10 GHz

Xiangyang Jiao; Pratik Maheshwari; Victor Khikevich; Paul Dixon; Yoeri Arien; Alpesh Bhobe; Jing Li; Xiao Li; David Pommerenke; James Drewniak; Hamed Kajbaf; Jin Min

doi:10.1109/ISEMC.2014.6898960

EMI mitigation with lossy material at 10 GHz

Xiangyang Jiao, Pratik Maheshwari, Victor Khikevich, Paul Dixon, Yoeri Arien, Alpesh Bhobe, Jing Li, Xiao Li, David Pommerenke, James Drewniak, Hamed Kajbaf, Jin Min

Research output: Contribution to journal › Conference article › peer-review

Abstract

In this paper, absorber material is utilized to mitigate an EMI problem in real hardware. For a complex and large system, identification of the source location is the first problem which must be solved to achieve electromagnetic interference (EMI) mitigation. Emission Source Microscopy (ESM) provides a powerful tool for locating the sources of radiation in GHz range on a printed circuit board (PCB). Once the source is identified, a suitable volume of the absorber material is placed on the source location to effectively reduce the radiated power at the frequency of interest. Further measurements of the total radiated power in a reverberation chamber are also performed to validate the EMI reduction method with the absorber material.

Original language	English
Article number	6898960
Pages (from-to)	150-154
Number of pages	5
Journal	IEEE International Symposium on Electromagnetic Compatibility
Volume	2014-September
Issue number	September
DOIs	https://doi.org/10.1109/ISEMC.2014.6898960
Publication status	Published - 15 Sept 2014
Externally published	Yes
Event	2014 IEEE International Symposium on Electromagnetic Compatibility: EMC 2014 - Raleigh, United States Duration: 3 Aug 2014 → 8 Aug 2014

Keywords

Absorber material
EMI
Emission source microscopy
Source localization

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/ISEMC.2014.6898960

Cite this

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title = "EMI mitigation with lossy material at 10 GHz",

abstract = "In this paper, absorber material is utilized to mitigate an EMI problem in real hardware. For a complex and large system, identification of the source location is the first problem which must be solved to achieve electromagnetic interference (EMI) mitigation. Emission Source Microscopy (ESM) provides a powerful tool for locating the sources of radiation in GHz range on a printed circuit board (PCB). Once the source is identified, a suitable volume of the absorber material is placed on the source location to effectively reduce the radiated power at the frequency of interest. Further measurements of the total radiated power in a reverberation chamber are also performed to validate the EMI reduction method with the absorber material.",

keywords = "Absorber material, EMI, Emission source microscopy, Source localization",

author = "Xiangyang Jiao and Pratik Maheshwari and Victor Khikevich and Paul Dixon and Yoeri Arien and Alpesh Bhobe and Jing Li and Xiao Li and David Pommerenke and James Drewniak and Hamed Kajbaf and Jin Min",

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AU - Jiao, Xiangyang

AU - Maheshwari, Pratik

AU - Khikevich, Victor

AU - Dixon, Paul

AU - Arien, Yoeri

AU - Bhobe, Alpesh

AU - Li, Jing

AU - Li, Xiao

AU - Pommerenke, David

AU - Drewniak, James

AU - Kajbaf, Hamed

AU - Min, Jin

PY - 2014/9/15

Y1 - 2014/9/15

N2 - In this paper, absorber material is utilized to mitigate an EMI problem in real hardware. For a complex and large system, identification of the source location is the first problem which must be solved to achieve electromagnetic interference (EMI) mitigation. Emission Source Microscopy (ESM) provides a powerful tool for locating the sources of radiation in GHz range on a printed circuit board (PCB). Once the source is identified, a suitable volume of the absorber material is placed on the source location to effectively reduce the radiated power at the frequency of interest. Further measurements of the total radiated power in a reverberation chamber are also performed to validate the EMI reduction method with the absorber material.

AB - In this paper, absorber material is utilized to mitigate an EMI problem in real hardware. For a complex and large system, identification of the source location is the first problem which must be solved to achieve electromagnetic interference (EMI) mitigation. Emission Source Microscopy (ESM) provides a powerful tool for locating the sources of radiation in GHz range on a printed circuit board (PCB). Once the source is identified, a suitable volume of the absorber material is placed on the source location to effectively reduce the radiated power at the frequency of interest. Further measurements of the total radiated power in a reverberation chamber are also performed to validate the EMI reduction method with the absorber material.

KW - Absorber material

KW - EMI

KW - Emission source microscopy

KW - Source localization

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JO - IEEE International Symposium on Electromagnetic Compatibility

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T2 - 2014 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 3 August 2014 through 8 August 2014

ER -

EMI mitigation with lossy material at 10 GHz

Abstract

Keywords

ASJC Scopus subject areas

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