Abstract
An empirical modeling of contact nonlinearity-induced intermodulation (IM) effect on the coaxial connector is presented in this article. The IM weights on inner and outer conductors are clarified using the measurement method. The contact degeneration-induced IM evolution is quantized by considering the contact coupling effect between the inner and outer conductors. This article demonstrated a set of test methods to quantify the oxide-induced nonlinearity with contact degeneration effects, and these methods can evaluate the contact IM products and further predict the low IM lifetime of passive devices
Original language | English |
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Article number | 8924674 |
Pages (from-to) | 5091-5099 |
Number of pages | 9 |
Journal | IEEE Transactions on Instrumentation and Measurement |
Volume | 69 |
Issue number | 7 |
DOIs | |
Publication status | Published - Jul 2020 |
Keywords
- Conductors
- Contacts
- Force
- Connectors
- Resistance
- Junctions
- Surface treatment
- Coaxial connectors
- contact degeneration
- passive intermodulation (IM)
- unstable nonlinearity