Enhanced Active Learning of Convolutional Neural Networks: A Case Study for Defect Classification in the Semiconductor Industry

Georgios Koutroulis*, Tiago Filipe Teixeira dos Santos, Michael Wiedemann, Christian Faistauer, Roman Kern, Stefan Thalmann

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationProceedings of the 12th International Joint Conference on Knowledge Discovery, Knowledge Engineering and Knowledge Management, IC3K 2020, Volume 1: KDIR, Budapest, Hungary, November 2-4, 2020
Publication statusPublished - 2020

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